Simyog’s vision is a harmonious integration of physical science and data science to enable cost-effective and performance rich automotive electronic design through early stage failure detection, saving bill-of-materials and reducing time-to- market.
Order of magnitude computational time improvement over current leading commercial solution methodologies.
Novel technology to harness information from previous simulation to accelerate solution of design iterations. Read more
World’s first technology to automatically identify parts of the design that are responsible for undesired electromagnetic effects, without the requirement of repetitive expensive re-runs. Read more
Algorithms chosen and tailored for minimizing serial content in accordance to Amdahl’s law. Read more
Compliance-Scope, is a Virtual EMI/EMC laboratory where designers can validate and improve their hardware at an early stage by uploading their design files. The tool also provides diagnosis and suggestions for low-cost fixes at the Printed Circuit Board level. Read more
The Bulk Current Injection (BCI) method is mainly used for RF immunity testing of automotive components and ICs in electronics industry. In this test method , current is injected on one or more pins simultaneously to test for malfunctions.
Radiated emissions testing involves measuring the electromagnetic field strength of the emissions that are unintentionally generated by the device. Emissions are inherent to the switching voltages and currents in the device.
Radiated immunity test is to measure the immunity of device when subject to prescribed radiated electromagnetic field.
The transverse electromagnetic mode (TEM) cell, is used for measuring the IC immunity to electromagnetic fields . Electromagnetic interference is injected in the cell and a test PCB containing the IC to be measured is inserted in an aperture on the outer wall, with the chip inside the cell.
Direct power injection method is used to measure the immunity of IC in presence of conducted RF noise. This test is aimed to evaluate semiconductor devices which work in an environment, subject to unwanted RF electromagnetic waves.
Conducted emission is to find out the radio frequency noise present in the physical wiring or traces of an electrical system due to any switching or harmonic resonances within a equipment.