Pioneers in Virtual EMI/EMC Laboratory

SimYog Spectrum

A quarterly newsletter from SimYog Technology

Feature in Focus

Smart Net Selection revolutionizes PCB EMC analysis by letting engineers import only relevant nets and components, drastically cutting simulation time and memory usage. This interactive, graph-based tool simplifies connectivity verification and accelerates workflows, making complex multi-layer PCB simulations faster, more efficient, and easier to manage.

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Engineering Deep Dive

EMC-Informed Adaptive Frequency Sweep

Discover how EMC-informed Adaptive Frequency Sweep (AFS) smartly targets critical resonances missed by traditional methods. By using system response insights, this approach boosts accuracy and speeds up EMI-EMC simulations—delivering reliable results with less computation. Learn how this innovation transforms electromagnetic testing workflows.

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News and Updates

Compliance-Scope 4.9.0 released with advanced new features like smart net selection and EMC-inspired Adaptive Frequency Sweep.
Fred Phillips joined as VP, Business Development, North America. More news here.
Nikita Ambasana addressed the fundamental question: “Frustrated with EMI/EMC issues in late stage testing?" in a webinar hosted by Hexagon Manufacturing Intelligence-India.
Praphul from Hexagon Manufacturing Intelligence presented “Master Electronics Cooling and EMI Compliance” using Cradle and Compliance-Scope at India Electronics Expo 2025.
Dipanjan Gope presented “Model-based EMC simulation for Design-for-EMC” organized by IEEE Dallas EPS chapter.

Upcoming Events

SimYog welcomes you to our booth #815 at 2025 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (IEEE EMC+SIPI 2025) to be held from Aug 18-22 at Raleigh Convention Center, North Carolina.
Dipanjan Gope will present “Exemplary Paper” on “Multiscale EMC modeling, simulation, and Validation of a synchronous step-down DC-DC converter” co-authored by colleagues from Texas Instruments and SimYog.
Mark your calendar: Tuesday, Aug 19th 13:30PM at IEEE EMC SI-PI conference in Raleigh.
Our work titled “Radiated Immunity failure debugging of a high-side driver using EMI modeling“ co-authored with colleagues from Texas Instruments will be presented on Thursday Aug 21 13:30PM at IEEE EMC SI-PI conference, Raleigh.
Ready for a fully functional Linux UI and 2x solver speed-up in Compliance-Scope? v4.10.0 is round the corner.

Global EMC News

Microwave Journal: New EMI Feedthrough Filter for USB 3.0
A spotlight from Microwave Journal: Ranatec has released a passive panel-mount USB 3.0 SuperSpeed feedthrough EMI filter, solving interference issues in environments requiring high-speed data integrity...[Read more]
Shielding Standards: From Large Enclosures to Board-Level (IEEE 299™, 299.1™, 2716™)
IEEE EMC Society and IEEE Standards Association hosted a detailed session on IEEE 299™, 299.1™, and 2716™ covering effectiveness metrics from full-scale enclosures down to PCB-level shielding. Includes updates from the Shielding Standards Continuity Group. [Read more]
IEEE EMC+SIPI 2025 - August 18–22, 2025
Raleigh Convention Center, Raleigh, North Carolina, USA
EMC Europe 2025 - September 01–05, 2025
Paris, France

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